Community

AES Journal Forum

Optical Diffraction Methods for Analysis and Control of Pit Geometry on Optical Disks

Document Thumbnail

In the optical disk mastering process information is recorded on the master disk surface in the form of a sequence of pits. For analysis and control of the disk manufacturing process, the dimension of such pits are assessed with optical diffraction measurements. The results of such measurements can be interpreted in a relatively simple way by using scalar diffraction theory.

Author:
Affiliation:
JAES Volume 41 Issue 1/2 pp. 19-31; February 1993
Publication Date:

Click to purchase paper as a non-member or you can login as an AES member to see more options.

No AES members have commented on this paper yet.

Subscribe to this discussion

RSS Feed To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.

Start a discussion!

If you would like to start a discussion about this paper and are an AES member then you can login here:
Username:
Password:

If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.

AES - Audio Engineering Society