The scanning electron microscope (SEM) has only recently become generally available as a commercial device. The combination of high resolution and high magnification with a remarkable depth of focus provided by the SEM, together with simple procedures in specimen preparation, make this instrument admirably suited for use in disc-recording research and development. A description of the SEM is given, and photomicrographs of details of recording and playback styli and of new and worn groove walls in records are shown.

Authors: Woodward, J. G.; Coutts, M. D.; Levin, E. R.
Affiliation: RCA Laboratories, Princeton, NJ
JAES Volume 16 Issue 3 pp. 258-265; July 1968
Publication Date: July 1, 1968

Click to purchase paper as a non-member or you can login as an AES member to see more options.

No AES members have commented on this paper yet.

Subscribe to this discussion

To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.

Start a discussion!

If you would like to start a discussion about this paper and are an AES member then you can login here:
Username:
Password:

If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.