A method to characterize the scattering from baffled diffusing surfaces has been developed, based on the difference between the scattering from the baffle with and without the diffusor. Previous diffusion parameters have concentrated on unbaffled surfaces. In many applications, however, diffusors are mounted in walls. The new diffusion parameter allows surfaces to be evaluated and measured in more realistic setups.

Author: Cox, Trevor J.
Affiliation: South Bank University, London, UK
AES Convention: 99 (October 1995) Paper Number: 4115
Publication Date: October 1, 1995
Subject: Acoustic Diffusion

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