A nondestructive flaw detection technique, based on a contactless device is presented. To demonstrate its applicability, measurements have been performed on several A1 plates before and after flawing them with one or more scratches. A spectrum analysis shows a significant change in the height of the odd harmonics, which increases with the number and size of the scratches.

Authors: Cherek, B.; Armannson, J. H.; Delsanto, P. P.
Affiliations: Aalborg University, Aalborg, Denmark ; Politechnico di Torino, Torino, Italy(See document for exact affiliation information.)
AES Convention: 86 (March 1989) Paper Number: 2785
Publication Date: March 1, 1989
Subject: Measurement & Instrumentation

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