A method of measuring surface impedance in-situ is presented. A source is set close to the surface of the material, in order to minimize the finite dimension effect of the sample, and the effect of the reflections on the walls and the ceiling of the room. The pressure above the material is measured simultaneously with two microphones, and measurement is compared a model of Hayek.

Authors: Allard, Jean-F.; Champoux, Yvan
Affiliation: University of Maine, Le Mans, France
AES Convention: 86 (March 1989) Paper Number: 2786
Publication Date: March 1, 1989
Subject: Measurement & Instrumentation

Click to purchase paper as a non-member or you can login as an AES member to see more options.

No AES members have commented on this paper yet.

Subscribe to this discussion

To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.

Start a discussion!

If you would like to start a discussion about this paper and are an AES member then you can login here:
Username:
Password:

If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.