The use of ESPI now enables the advantages of whole field component analysis to be applied in real time to inspect equipment in workshop facilities. This paper will attempt to identify some recent developments which now yield high quality quantifiable results to the engineering community. The results given will concentrate on applications concerning both the component response and the system response. ESPI combines the benefits of holographic optical data with the ability to undertake digital image processing.

Author: Tyrer, John R.
Affiliation: Department of Mechanical Engineering, Loughborough University of Technology, Loughborough, England
AES Convention: 82 (March 1987) Paper Number: 2482
Publication Date: March 1, 1987
Subject: Measurement and Instrumentation

Click to purchase paper as a non-member or you can login as an AES member to see more options.

No AES members have commented on this paper yet.

Subscribe to this discussion

To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.

Start a discussion!

If you would like to start a discussion about this paper and are an AES member then you can login here:
Username:
Password:

If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.