Large-scale ATE will be discussed, along with its application to the following manufacturing processes. Incoming inspection of piece parts, final test before shipment, and statistical feedback to engineering. Examples are given of devices that can be tested by ATE, and computer-driven test programs and outcomes are shown. These examples include an FM radio IF Strip and Demodulator Integrated Circuit, a Tick and Pop Suppressor, an AM Radio I.C., and a high fidelity D.C.-controlled bass, treble, volume and loudness integrated circuit. other uses of ATE are shown to include high-speed, high-accuracy testing of D/A and A/D converters, necessary to the age of digital audio and instrumentation, and scientific problem-solving using the ATE system computer and software.
Author:
Talbot, Daniel B.
Affiliation:
LTX Corporation, Newton Highlands, MA
AES Convention:
67 (October 1980)
Paper Number:
1698
Publication Date:
October 1, 1980
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