A new distortion measuring method will be presented which uses a test signal that consists of multiple tones. The frequencies of the tones are selected so that their derivations, such as harmonic and intermodulation products, do not coincide with each other or with the applied tones. Assuming that the measured distortion is caused by second and third-power nonlinearities of the device under test, this enables us to track down the source of the distortion in the system. The measurements and signal processing are carried out under the control of a computer. Some measurement results on distortion-simulating circuits and power amplifiers will be presented, and the validity of this method will be discussed.

Authors: Muraoka, Teruo; Wagatsuma, Kikuji; Yamazaki, Masami
Affiliation: Victor Company of Japan, Ltd., Tokyo, Japan
AES Convention: 61 (November 1978) Paper Number: 1396
Publication Date: November 1, 1978

Click to purchase paper as a non-member or you can login as an AES member to see more options.

No AES members have commented on this paper yet.

Subscribe to this discussion

To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.

Start a discussion!

If you would like to start a discussion about this paper and are an AES member then you can login here:
Username:
Password:

If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.