Various new methods are described which allow high accuracy in measuring small-signal transducer parameters. The tests are non-destructive and are applied to complete operating transducers. Analysis of these accurate measurements leads to a better understanding of the limitations of the design of typical transducers and to improved modelling of the equivalent electrical circuit.

Author: Elliott, Brian J.
Affiliation: Computer Sciences Department, IBM T.J. Watson Research Center, Yorktown Heights, NY
AES Convention: 61 (November 1978) Paper Number: 1432
Publication Date: November 1, 1978

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