There is a considerable amount of controversy and misconception surrounding this relatively new control room design concept. The authors propose to outlline the original test data, obtained via TDS, which provided the formulative basis of the concept, and the subsequent developments provided through the use of the Time-Energy-Frequency test system.
Authors:
Davis, Chips; Meeks, Glenn E.
Affiliations:
LEDE Designs, Las Vegas, NV ; E. A. Designs, Indianapolis, IN(See document for exact affiliation information.)
AES Convention:
72 (October 1982)
Paper Number:
1954
Publication Date:
October 1, 1982
Subject:
Studio Design and Technology
Click to purchase paper as a non-member or you can login as an AES member to see more options.
No AES members have commented on this paper yet.
To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.
If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.