This paper reviews the treatment of non-linear distortion as a mathematical process, which can also be visualized graphically. It will also be shown that a spectrum analyzer (or wave analyzer) can be used to learn whether the order of a particular distortion frequency-component is caused by square-law or cubic distortion in the device. The concept of second and third-order intercept point will be reviewed. There will also be a discussion of high-frequency oscillation-produced low-frequency distortion, differential phase distortion, and quadrature distortion.
Author:
Talbot, Daniel B.
Affiliation:
Talbot Technology (T-TECH) Corp., Hudson, MA
AES Convention:
76 (October 1984)
Paper Number:
2134
Publication Date:
October 1, 1984
Subject:
Instrumentation and Measurement
Click to purchase paper as a non-member or you can login as an AES member to see more options.
No AES members have commented on this paper yet.
To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.
If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.