The standard Thiel/Small analysis techniques have made possible an accurate method for modeling the low frequency characteristics of dynamic transducers. A new computer program has been developed based on a combined lumped/distributed system analysis which permits the quantization of various parasitic parameters (such as box leakage resistance) through an iteration technique. The approach taken and various results will be discussed.
Authors:
Blind, Henry; Dorfstatter, Walter; Geddes, Earl
Affiliation:
Ford Motor Company, Dearborn, MI
AES Convention:
78 (May 1985)
Paper Number:
2234
Publication Date:
May 1, 1985
Subject:
Reproduction
Click to purchase paper as a non-member or you can login as an AES member to see more options.
No AES members have commented on this paper yet.
To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.
If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.