An improvement of loudspeaker baffle measurements is presented. The proposed method uses impedance-based measurement for low frequencies, and this response is used to correct an acoustically measured impulse response before the diffraction from the baffle edges is gated out. The low-frequency response can then be used to process the gated response, yielding an improvement in low-frequency responses over previous methods.
Author:
Backman, Juha
Affiliations:
Nokia Mobile Phones, Espoo, Finland ; Helsinki University of Technology, Acoustics Laboratory, Espoo, Finland(See document for exact affiliation information.)
AES Convention:
112 (April 2002)
Paper Number:
5510
Publication Date:
April 1, 2002
Subject:
Loudspeakers
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