In order to measure the performance of a brand new A/D converter chip, many subtleties must be addressed in the external components and test set-up in order to make sure that the performance is not degraded, and to make sure that the measurements are valid. This becomes especially true when the A/D converter has a noise floor and distortion performance which rivals the specifications of the highest quality test equipment. This paper briefly describes the architecture of the A/D converter, discusses some trade-offs in the external circuit design and concludes with some measurement issues and results. The techniques discussed also form a basis for users' own designs, allowing predictable realization of maximum performance.

Authors: Harris, Steven; Green, Steven; Leung, Ka
Affiliation: Crystal Semiconductor, Austin, TX
AES Conference: UK 12th Conference: The Measure of Audio (MOA) (April 1997)
Paper Number: MOA-16
Publication Date: April 1, 1997
Subject: The Measure of Audio

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