This paper discusses the generation of production test limits from circuit analysis software utilizing Monte Carlo techniques. The general process of converting data from PSpice- and Micro-Cap III- is described. A specific example of directly converting data from PSpice Monte Carlo analysis into Audio Precision System One- test limits is shown.
Authors:
Jeffs, Rick; Cook, Devin
Affiliation:
Rane Corporation, Mukilteo,WA
AES Conference:
11th International Conference: Test & Measurement (May 1992)
Paper Number:
11-008
Publication Date:
May 1, 1992
Subject:
Test & Measurement
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