A comprehensive system for doing production testing of loudspeakers and systems is described. Multiple TEF analyzers can be controlled by a single host computer to create elaborate test environments. The software allows the test engineer to orchestrate very complex test sequences while simultaneously minimizing the perceived complexity of the system as viewed by the test operator. Tests that can be incorporated in the test sequence, with pass/fail window parameters, include any or all of the following (in any order): frequency response, phase response (polarity), harmonic tracking, harmonic distortion (of specific harmonics), THD, THD and noise, spectrum analysis (FFT), and impedance. Options include the capability to completely store all the raw data from a test run for after-the-fact review and analysis.

Authors: Schwing, Donald; Keele, Jr., D. B. (Don)
Affiliations: Techron, Div. Crown International Inc., Elkhart, IN ; DBK Associates and Consultant to Techron, Div. Crown International Inc., Elkhart, IN(See document for exact affiliation information.)
AES Conference: 11th International Conference: Test & Measurement (May 1992)
Paper Number: 11-032
Publication Date: May 1, 1992
Subject: Test & Measurement

Click to purchase paper as a non-member or you can login as an AES member to see more options.

No AES members have commented on this paper yet.

Subscribe to this discussion

To be notified of new comments on this paper you can subscribe to this RSS feed. Forum users should login to see additional options.

Start a discussion!

If you would like to start a discussion about this paper and are an AES member then you can login here:
Username:
Password:

If you are not yet an AES member and have something important to say about this paper then we urge you to join the AES today and make your voice heard. You can join online today by clicking here.